@misc{indiciaecb9c2a368926,
  title = {Statistical White-Line Analysis in High-Throughput TXM-XANES for Chemical State Quantification},
  author = {Wang, Jing [Univ. of Chicago, IL (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] and Zuo, Wenhua [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000319772775) and Huang, Weiyuan [Argonne National Laboratory (ANL), Argonne, IL (United States)] and Liu, Tongchao [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000260103891) and Xu, Guiliang [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:000000019969883X) and Xiao, Xianghui [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source (NSLS)] (ORCID:0000000271423452)},
  year = {2026},
  doi = {10.1021/photonsci.5c00020},
  url = {https://www.osti.gov/biblio/3024711},
  note = {Source identifier: 3024711}
}