TY  - RPRT
TI  - Statistical White-Line Analysis in High-Throughput TXM-XANES for Chemical State Quantification
AU  - Wang, Jing [Univ. of Chicago, IL (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)]
AU  - Zuo, Wenhua [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000319772775)
AU  - Huang, Weiyuan [Argonne National Laboratory (ANL), Argonne, IL (United States)]
AU  - Liu, Tongchao [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000260103891)
AU  - Xu, Guiliang [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:000000019969883X)
AU  - Xiao, Xianghui [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source (NSLS)] (ORCID:0000000271423452)
PY  - 2026
DO  - 10.1021/photonsci.5c00020
UR  - https://www.osti.gov/biblio/3024711
ID  - 3024711
ER  -