TY  - RPRT
TI  - Thermal Metrology and Subsurface Evaluation of Heterogeneously Integrated Microelectronics
AU  - Jarzembski, Amun [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
AU  - Yates, Luke [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000150528944)
AU  - Neely, Jason Christopher [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000287573228)
AU  - Piontkowski, Zachary Tyler [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000262820106)
AU  - Bahr, Matthew Nathaniel [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000759593938)
AU  - Jordan, Matthew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000345262664)
AU  - Jauregui, Luis Jose [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000308978444)
AU  - Lu, Ping [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000293697462)
AU  - Hodges, Wyatt Lea [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000303868908)
AU  - Nair, Siddharth [Purdue University]
AU  - Semperlotti, Fabio [Purdue University]
PY  - 2025
DO  - 10.2172/3027408
UR  - https://www.osti.gov/biblio/3027408
ID  - 3027408
ER  -