@misc{indiciae1db337814fdc,
  title = {A Radiation-Aware Model for Analyzing Degradation in Optoelectronic Devices},
  author = {Hughes, Eamonn Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000324286923) and Chow, Weng Wah [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] and Vizkelethy, Gyorgy [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000236522519) and Skogen, Erik J. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] and Fortuna, Seth Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000673355066)},
  year = {2025},
  doi = {10.2172/3027431},
  url = {https://www.osti.gov/biblio/3027431},
  note = {Source identifier: 3027431}
}