TY  - RPRT
TI  - A Radiation-Aware Model for Analyzing Degradation in Optoelectronic Devices
AU  - Hughes, Eamonn Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000324286923)
AU  - Chow, Weng Wah [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
AU  - Vizkelethy, Gyorgy [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000236522519)
AU  - Skogen, Erik J. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
AU  - Fortuna, Seth Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000673355066)
PY  - 2025
DO  - 10.2172/3027431
UR  - https://www.osti.gov/biblio/3027431
ID  - 3027431
ER  -