@misc{indiciae189b1856e858,
  title = {Total Ionizing Dose Effects on Gallium Oxide MOSFETs},
  author = {Cadena, Rick [Vanderbilt University] and Smith, Michael Brandon [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000186229284) and Wilcox, Ian Zachary [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000764290181) and Charnas, Adam R. [AFRL] and Gorsak, Cameron [AFRL] and Nair, Hari [AFRL] and Green, Andrew [Air Force Research Laboratory] and Neal, Adam [AFRL] and Ball, Dennis [Vanderbilt University] and Witulski, Arthur F. [External Affiliation] and Schrimpf, Ronald [Vanderbilt University]},
  year = {2025},
  doi = {10.2172/3027437},
  url = {https://www.osti.gov/biblio/3027437},
  note = {Source identifier: 3027437}
}