@misc{indiciae72b69c6e13c6,
  title = {Data driven methods to recognize patterns in EIC weak-strong simulation},
  author = {Fung, William [Michigan State Univ., East Lansing, MI (United States)]},
  year = {2025},
  doi = {10.18429/jacow-ipac2025-wepm019},
  url = {https://www.osti.gov/biblio/3029507},
  note = {Source identifier: 3029507}
}