TY  - RPRT
TI  - Securing 3D NAND Without Density Loss via In-Situ Encryption Using a Single Transistor XOR Cell
AU  - Duan, Jiahui [University of Notre Dame, IN (United States)]
AU  - Ovy, Sanwar Ahmed [North Dakota State Univ., Fargo, ND (United States)]
AU  - Hsu, Po-Kai [Georgia Institute of Technology, Atlanta, GA (United States)]
AU  - Zhao, Zijian [University of Notre Dame, IN (United States)]
AU  - Kämpfe, Thomas [Fraunhofer Inst. for Photonic Microsystems, Dresden (Germany)]
AU  - Gong, Xiao [National Univ. of Singapore (Singapore)]
AU  - Yu, Shimeng [Georgia Institute of Technology, Atlanta, GA (United States)]
AU  - Narayanan, Vijaykrishnan [Pennsylvania State Univ., University Park, PA (United States)]
AU  - George, Sumitha [North Dakota State Univ., Fargo, ND (United States)]
AU  - Ni, Kai [University of Notre Dame, IN (United States)]
PY  - 2025
DO  - 10.1109/iedm50572.2025.11353898
UR  - https://www.osti.gov/biblio/3029552
ID  - 3029552
ER  -