TY  - RPRT
TI  - Vertical 2T-nC FeRAM Demonstration: BEOL Read Transistor for 4F 2 Memory Strings and Two-Terminal Selector Design for Polarization Disturb Mitigation
AU  - Deng, Shan [University of Notre Dame, IN (United States)]
AU  - Howe, John [University of Notre Dame, IN (United States)]
AU  - Ma, Sizhe [University of Notre Dame, IN (United States)]
AU  - Tauki, Sadik Yasir [Pennsylvania State Univ., University Park, PA (United States)]
AU  - Zhao, Zijian [University of Notre Dame, IN (United States)]
AU  - Duan, Jiahui [University of Notre Dame, IN (United States)]
AU  - Lee, YuShan [University of Notre Dame, IN (United States)]
AU  - Qin, Yixin [University of Notre Dame, IN (United States)]
AU  - Joshi, Rajiv [IBM, Yorktown Heights, NY (United States). Thomas J. Watson Research Center]
AU  - Kampfe, Thomas [Fraunhofer Inst. for Photonic Microsystems, Dresden (Germany)]
AU  - Gong, Xiao [National Univ. of Singapore (Singapore)]
AU  - Narayanan, Vijaykrishnan [Pennsylvania State Univ., University Park, PA (United States)]
AU  - Ni, Kai [University of Notre Dame, IN (United States)]
PY  - 2025
DO  - 10.23919/vlsitechnologyandcir65189.2025.11074964
UR  - https://www.osti.gov/biblio/3029568
ID  - 3029568
ER  -