TY  - RPRT
TI  - Model Risk Assessment for an Electromagnetic Application
AU  - Neal, Kyle Daniel [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000178801498)
AU  - Krueger, Aaron Martin [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000000032228406X)
AU  - Pack, Alden Roy [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
AU  - Karve, Pranav M. [Vanderbilt University]
AU  - Mahadevan, Sankaran [Vanderbilt University]
AU  - Mullins, Joshua Grady [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0009000358078783)
PY  - 2025
DO  - 10.2172/3029784
UR  - https://www.osti.gov/biblio/3029784
ID  - 3029784
ER  -