@misc{indiciae691129c69709,
  title = {Characterization of Electronic Stress-Induced Changes in Multilayer MoS 2},
  author = {Evans, R. Colby [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)] (ORCID:000000022134238X) and Torsi, Riccardo [National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)] and Kabos, Pavel [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)] and Holm, Jason [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)] and Killgore, Jason P. [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)] (ORCID:0000000284586680) and Owiredu, Paul [Kansas State Univ., Manhattan, KS (United States)] and Singh, Gurpreet [Kansas State Univ., Manhattan, KS (United States)] (ORCID:0000000321269204) and Sadowski, Jerzy T. [Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)] (ORCID:0000000243657796) and Hight Walker, Angela R. [National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)] (ORCID:0000000313850672) and Mansfield, Elisabeth [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)] (ORCID:0000000324630966)},
  year = {2026},
  doi = {10.1021/acsaelm.6c00080},
  url = {https://www.osti.gov/biblio/3029877},
  note = {Source identifier: 3029877}
}