TY  - RPRT
TI  - Characterization of Electronic Stress-Induced Changes in Multilayer MoS 2
AU  - Evans, R. Colby [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)] (ORCID:000000022134238X)
AU  - Torsi, Riccardo [National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)]
AU  - Kabos, Pavel [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)]
AU  - Holm, Jason [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)]
AU  - Killgore, Jason P. [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)] (ORCID:0000000284586680)
AU  - Owiredu, Paul [Kansas State Univ., Manhattan, KS (United States)]
AU  - Singh, Gurpreet [Kansas State Univ., Manhattan, KS (United States)] (ORCID:0000000321269204)
AU  - Sadowski, Jerzy T. [Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)] (ORCID:0000000243657796)
AU  - Hight Walker, Angela R. [National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)] (ORCID:0000000313850672)
AU  - Mansfield, Elisabeth [National Inst. of Standards and Technology (NIST), Boulder, CO (United States)] (ORCID:0000000324630966)
PY  - 2026
DO  - 10.1021/acsaelm.6c00080
UR  - https://www.osti.gov/biblio/3029877
ID  - 3029877
ER  -