@misc{indiciaea2a51437df30,
  title = {Infrared triggered dwell and active cooling thermal control effects on microstructural uniformity in DED},
  author = {Haley, James C. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000290233048) and Fancher, Chris [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000239525168) and Shankar Nln, Gyan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000216504751) and Saleeby, Kyle [Georgia Institute of Technology, Atlanta, GA (United States)] (ORCID:0000000275238174) and Kimmel, Calen [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000169262832) and Potter, John [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0009000624776032) and Tang, Wei [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000292749574) and An, Ke [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000026093429X) and Yu, Dunji [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000189467851) and Plotkowski, Alex [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000154718681)},
  year = {2026},
  doi = {10.1016/j.addma.2026.105088},
  url = {https://www.osti.gov/biblio/3030462},
  note = {Source identifier: 3030462}
}