TY  - RPRT
TI  - Infrared triggered dwell and active cooling thermal control effects on microstructural uniformity in DED
AU  - Haley, James C. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000290233048)
AU  - Fancher, Chris [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000239525168)
AU  - Shankar Nln, Gyan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000216504751)
AU  - Saleeby, Kyle [Georgia Institute of Technology, Atlanta, GA (United States)] (ORCID:0000000275238174)
AU  - Kimmel, Calen [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000169262832)
AU  - Potter, John [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0009000624776032)
AU  - Tang, Wei [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000292749574)
AU  - An, Ke [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000026093429X)
AU  - Yu, Dunji [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000189467851)
AU  - Plotkowski, Alex [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000154718681)
PY  - 2026
DO  - 10.1016/j.addma.2026.105088
UR  - https://www.osti.gov/biblio/3030462
ID  - 3030462
ER  -