TY  - RPRT
TI  - Towards Mitigating Electron Beam-Induced Damage in MOFs Using Low Dose Electron Microscopy for In-Situ Room-Temperature Measurements
AU  - dos Santos, Gabriel T. [Northwestern University, Evanston, IL (United States)]
AU  - Dravid, Vinayak P. [Northwestern University, Evanston, IL (United States)]
AU  - dos Reis, Roberto [Northwestern University, Evanston, IL (United States)]
PY  - 2025
DO  - 10.1093/mam/ozaf048.076
UR  - https://www.osti.gov/biblio/3030606
ID  - 3030606
ER  -