TY  - RPRT
TI  - Characterizing Defect Dynamics in Silicon Carbide Using Symmetry-Adapted Collective Variables and Machine Learning Interatomic Potentials
AU  - Dutta, Soumajit [University of Chicago, IL (United States)] (ORCID:0000000339518088)
AU  - Zhang, Cunzhi [University of Chicago, IL (United States)]
AU  - Lemus, Gustavo Perez [University of Chicago, IL (United States)]
AU  - de Pablo, Juan J. [New York University, NY (United States)]
AU  - Gygi, Francois [University of California, Davis, CA (United States)] (ORCID:0000000222876017)
AU  - Galli, Giulia [University of Chicago, IL (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000280015290)
AU  - Ferguson, Andrew L. [University of Chicago, IL (United States)] (ORCID:0000000288299726)
PY  - 2026
DO  - 10.1021/acs.jctc.6c00063
UR  - https://www.osti.gov/biblio/3030657
ID  - 3030657
ER  -