TY  - RPRT
TI  - Cracking in polymer substrates for flexible electronic devices and its mitigation
AU  - Ranka, Anush [Brown Univ., Providence, RI (United States)]
AU  - Layek, Madhuja [Brown Univ., Providence, RI (United States)]
AU  - Kochiyama, Sayaka [Brown Univ., Providence, RI (United States)]
AU  - López-Pernia, Cristina [Brown Univ., Providence, RI (United States)]
AU  - Chandler, Alicia M. [Brown Univ., Providence, RI (United States)]
AU  - Kocoj, Conrad A. [Yale Univ., New Haven, CT (United States)]
AU  - Magliano, Erica [Tor Vergata Univ. of Rome (Italy)]
AU  - Di Carlo, Aldo [Tor Vergata Univ. of Rome (Italy); National Research Council (CNR), Rome (Italy)]
AU  - Brunetti, Francesca [Tor Vergata Univ. of Rome (Italy)]
AU  - Guo, Peijun [Yale Univ., New Haven, CT (United States)]
AU  - Suresh, Subra [Brown Univ., Providence, RI (United States)]
AU  - Paine, David C. [Brown Univ., Providence, RI (United States)]
AU  - Kesari, Haneesh [Brown Univ., Providence, RI (United States)]
AU  - Padture, Nitin P. [Brown Univ., Providence, RI (United States)]
PY  - 2025
DO  - 10.1038/s41528-025-00470-z
UR  - https://www.osti.gov/biblio/3226505
ID  - 3226505
ER  -