@misc{indiciaeed78334b8f9d,
  title = {Automated Bacterial Identification and Morphological Feature Analysis in Low‐Dose Cryo‐EM Using YOLOv11},
  author = {Madugula, Sita Sirisha [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:000000019944117X) and Massenburg, Lynnicia N. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:000000026590273X) and Brown, Spenser R. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000236658133) and Bible, Amber N. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000274310533) and Harris, Chanda R. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] and Zhang, Lance X. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] and Parker, Kiara [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0009000811671594) and Retterer, Scott T. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000185341979) and Morrell‐Falvey, Jennifer L. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000293627528) and Vasudevan, Rama K. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000346928579) and Williams, Alexis N. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000252835822)},
  year = {2026},
  doi = {10.1002/aidi.202500241},
  url = {https://www.osti.gov/biblio/3362860},
  note = {Source identifier: 3362860}
}