TY  - RPRT
TI  - High-throughput spin-bath characterization of spin defects in semiconductors
AU  - Poteshman, Abigail N. [University of Chicago, IL (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000248734826)
AU  - Onizhuk, Mykyta [University of Chicago, IL (United States)]
AU  - Egerstrom, Christopher [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)] (ORCID:0000000182407303)
AU  - Mark, Daniel P. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000212316016)
AU  - Awschalom, David D. [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)] (ORCID:0000000285912687)
AU  - Heremans, F. Joseph [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)]
AU  - Galli, Giulia [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)] (ORCID:0000000280015290)
PY  - 2025
DO  - 10.1103/p57x-8kk7
UR  - https://www.osti.gov/biblio/3363843
ID  - 3363843
ER  -