@misc{indiciae96dab27965c7,
  title = {Screening and qualification methodology for SiC end plug processing methods},
  author = {Arregui Mena, José David [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000261313268) and Petrie, Christian M. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000311673545) and Koyanagi, Takaaki [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000172724049)},
  year = {2026},
  doi = {10.2172/3365757},
  url = {https://www.osti.gov/biblio/3365757},
  note = {Source identifier: 3365757}
}