@misc{indiciae53256d6479e0,
  title = {Desmearing Bonse–Hart USANS data using Bayesian Gaussian process regression},
  author = {Tung, Chi-Huan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000221972074) and Huang, Guan-Rong [National Tsing Hua Univ., Hsinchu (Taiwan)] (ORCID:0000000163939574) and Shang, Yingrui [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000301743992) and Rother, Gernot [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000349216294) and Do, Changwoo [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000183588417) and Wang, Yangyang [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000170429804) and Carrillo, Jan-Michael [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:000000018774697X) and Semnani, Shabnam J. [Univ. of California, San Diego, CA (United States)] (ORCID:0000000166356905) and Zhang, Tao [Univ. of Texas, Arlington, TX (United States)] and Shinohara, Yuya [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000018284751X) and Chen, Wei-Ren [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000251920777)},
  year = {2026},
  doi = {10.1063/5.0320684},
  url = {https://www.osti.gov/biblio/3367052},
  note = {Source identifier: 3367052}
}