TY  - RPRT
TI  - Post-yield characterization of epoxy using waisted compression tests
AU  - DelRio, Frank William [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000317278220)
AU  - Clarke, Brandon David [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000293542935)
AU  - Huber, Todd [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
AU  - Reedy, E. Dave [External Affiliation]
AU  - Grutzik, Scott Joseph [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000264903941)
PY  - 2025
DO  - 10.2172/3367120
UR  - https://www.osti.gov/biblio/3367120
ID  - 3367120
ER  -