@misc{indiciaed97a80309525,
  title = {Data-driven Compact Models for Devices and Circuits: A System Identification Approach for Non-intrusive Reduced Order Modeling of Normal and Radiation Environments in Microelectronics},
  author = {Bochev, Pavel B. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000287217119) and Hanson, Joshua McKinley [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] and Paskaleva, Biliana Stefanova [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000259297836) and Kuberry, Paul Allen [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000224264591) and Musson, Lawrence Cale [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000569965630) and Thieme, Ethan Connor [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]},
  year = {2025},
  doi = {10.2172/3369092},
  url = {https://www.osti.gov/biblio/3369092},
  note = {Source identifier: 3369092}
}