TY  - RPRT
TI  - Data-driven Compact Models for Devices and Circuits: A System Identification Approach for Non-intrusive Reduced Order Modeling of Normal and Radiation Environments in Microelectronics
AU  - Bochev, Pavel B. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000287217119)
AU  - Hanson, Joshua McKinley [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
AU  - Paskaleva, Biliana Stefanova [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000259297836)
AU  - Kuberry, Paul Allen [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000224264591)
AU  - Musson, Lawrence Cale [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000569965630)
AU  - Thieme, Ethan Connor [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
PY  - 2025
DO  - 10.2172/3369092
UR  - https://www.osti.gov/biblio/3369092
ID  - 3369092
ER  -