TY  - RPRT
TI  - Minimization of Cathode|Solid-Electrolyte Interfacial Delamination through the Application of Interphase Layers
AU  - Barai, Pallab [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000322176392)
AU  - Rojas, Tomas [Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. of Costa Rica, San Jose (Costa Rica)]
AU  - Ngo, Anh T. [Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. of Illinois, Chicago, IL (United States)]
AU  - Curtiss, Larry A. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000188558006)
AU  - Srinivasan, Venkat [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000212485952)
PY  - 2025
DO  - 10.1021/acsaem.5c02049
UR  - https://www.osti.gov/biblio/3374056
ID  - 3374056
ER  -