@misc{indiciaee8e3aa65ed2b,
  title = {High-speed quantitative X-ray multi-contrast imaging with deep learning based modulated pattern analysis},
  author = {Qiao, Zhi [ShanghaiTech Univ. (China)] and Yao, Yudong [ShanghaiTech Univ. (China)] and Chen, Hongyu [ShanghaiTech Univ. (China)] and Du, Guohao [Chinese Academy of Sciences (CAS), Shanghai (China)] and Wen, Pingping [ShanghaiTech Univ. (China)] and Guan, Zhihao [ShanghaiTech Univ. (China)] and Tong, Yajun [ShanghaiTech Univ. (China)] (ORCID:0009000004948032) and Shi, Xianbo [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)] (ORCID:0000000210699981) and Jiang, Huaidong [ShanghaiTech Univ. (China)] (ORCID:0000000208951690)},
  year = {2026},
  doi = {10.1107/s1600577526000846},
  url = {https://www.osti.gov/biblio/3374544},
  note = {Source identifier: 3374544}
}