@misc{indiciae8bf14567efcd,
  title = {Transport Enabled Gates with Integrated Photonics on a Surface-Electrode Ion Trap},
  author = {Hogle, Craig William [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000531162058) and Sterk, Jonathan David [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000280396396) and Stick, Daniel Lynn [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000268027539)},
  year = {2025},
  doi = {10.2172/3374824},
  url = {https://www.osti.gov/biblio/3374824},
  note = {Source identifier: 3374824}
}