TY  - RPRT
TI  - Transport Enabled Gates with Integrated Photonics on a Surface-Electrode Ion Trap
AU  - Hogle, Craig William [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000531162058)
AU  - Sterk, Jonathan David [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000280396396)
AU  - Stick, Daniel Lynn [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000268027539)
PY  - 2025
DO  - 10.2172/3374824
UR  - https://www.osti.gov/biblio/3374824
ID  - 3374824
ER  -