@misc{indiciaeb563a77a8b25,
  title = {New perspectives on materials and device dynamics using time-resolved full-field diffraction X-ray imaging},
  author = {Yildirim, Can [European Synchrotron Radiation Facility (ESRF), Grenoble (France)] (ORCID:0000000249690685) and Schulli, Tobias U. [European Synchrotron Radiation Facility (ESRF), Grenoble (France)] and Zhou, Tao [Argonne National Laboratory (ANL), Argonne, IL (United States). Center for Nanoscale Materials (CNM)] and Dresselhaus-Marais, Leora [Stanford Univ., CA (United States)] and Evans, Paul G. [Univ. of Wisconsin, Madison, WI (United States)] (ORCID:0000000304216792)},
  year = {2026},
  doi = {10.1016/j.cossms.2026.101280},
  url = {https://www.osti.gov/biblio/3374865},
  note = {Source identifier: 3374865}
}