TY  - RPRT
TI  - Charged Defects in UO 2 Bulk and Surface: A First-Principles Study
AU  - Aryal, Sandip [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000172852198)
AU  - Wang, Gaoxue [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000348127257)
AU  - Batista, Enrique Ricardo [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000230744022)
AU  - Yang, Ping [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000347262860)
PY  - 2026
DO  - 10.1021/acsami.6c01154
UR  - https://www.osti.gov/biblio/3374904
ID  - 3374904
ER  -