TY - RPRT TI - An Atom-Precise Approach to Damp First-Order Phase Transitions and Its Implications for Neuromorphic Signal Processing AU - Agbeworvi, George [Texas A&M University, College Station, TX (United States)] (ORCID:0000000221261854) AU - Kumar, Nitin [University at Buffalo, The State University of New York, NY (United States)] AU - Ponis, John D. [Texas A&M University, College Station, TX (United States)] AU - Hariyani, Shruti [Texas A&M University, College Station, TX (United States); ETH Zurich (Switzerland); Paul Scherrer Institute (Switzerland)] (ORCID:0000000247078863) AU - Jerla, Nicholas [University at Buffalo, The State University of New York, NY (United States)] AU - Jardali, Fatme [Texas A&M University, College Station, TX (United States)] AU - Li, Jialu [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] AU - Zaheer, Wasif [Texas A&M University, College Station, TX (United States)] AU - Handy, Joseph V. [Texas A&M University, College Station, TX (United States)] AU - Ayala, Jaime R. [Texas A&M University, College Station, TX (United States)] (ORCID:0000000327304525) AU - Jaye, Cherno [National Institute of Standards and Technology, Gaithersburg, MD (United States)] AU - Weiland, Conan [National Institute of Standards and Technology, Gaithersburg, MD (United States)] AU - Fischer, Daniel A. [National Institute of Standards and Technology, Gaithersburg, MD (United States)] AU - Shamberger, Patrick J. [Texas A&M University, College Station, TX (United States)] (ORCID:0000000287376064) AU - Guo, Jinghua [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:0000000285762172) AU - Williams, R. Stanley [Texas A&M University, College Station, TX (United States)] (ORCID:0000000302134259) AU - Sambandamurthy, G. [University at Buffalo, The State University of New York, NY (United States)] AU - Banerjee, Sarbajit [ETH Zurich (Switzerland); Paul Scherrer Institute (Switzerland)] (ORCID:0000000220284675) PY - 2026 DO - 10.1021/jacs.6c02370 UR - https://www.osti.gov/biblio/3374916 ID - 3374916 ER -