TY  - RPRT
TI  - Data-driven plastic anisotropy characterization using crystal plasticity and deep learning models
AU  - Lim, Hojun [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000309844712)
AU  - Montes de Oca Zapiain, David [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000178900859)
AU  - Park, Taejoon [The Ohio State University]
PY  - 2025
DO  - 10.2172/3376533
UR  - https://www.osti.gov/biblio/3376533
ID  - 3376533
ER  -