@misc{indiciae07a9ea6efdf1,
  title = {Super-Resolution Processing of FDTR Measurement Data for Defect Detection},
  author = {Tencer, John Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000316255887) and Crites, Emily [Cornell University] and Hodges, Wyatt Lea [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000303868908)},
  year = {2025},
  doi = {10.2172/3378102},
  url = {https://www.osti.gov/biblio/3378102},
  note = {Source identifier: 3378102}
}