TY  - RPRT
TI  - Super-Resolution Processing of FDTR Measurement Data for Defect Detection
AU  - Tencer, John Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000316255887)
AU  - Crites, Emily [Cornell University]
AU  - Hodges, Wyatt Lea [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000303868908)
PY  - 2025
DO  - 10.2172/3378102
UR  - https://www.osti.gov/biblio/3378102
ID  - 3378102
ER  -