@misc{indiciae63c171a82a4c,
  title = {Validation Data for Benchmarking Wire Arc Additive Manufacturing Process Simulations},
  author = {Bachus, Nicholas [Univ. of California, Davis, CA (United States)] and Henriksen, Amelia [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies] and Hill, Michael [Univ. of California, Davis, CA (United States)] and Johnson, Kyle [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies] and Nycz, Andrzej [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000174156559) and Masuo, Chris [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000341605658) and Carter, William [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000203137534) and Roy, Sougata [Iowa State Univ., Ames, IA (United States)] (ORCID:0000000329501290) and Simunovic, Srdjan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000177668293) and Boyce, Brad L. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies] (ORCID:0000000159941743)},
  year = {2026},
  doi = {10.1007/s40192-026-00469-y},
  url = {https://www.osti.gov/biblio/3384999},
  note = {Source identifier: 3384999}
}