TY  - RPRT
TI  - Validation Data for Benchmarking Wire Arc Additive Manufacturing Process Simulations
AU  - Bachus, Nicholas [Univ. of California, Davis, CA (United States)]
AU  - Henriksen, Amelia [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies]
AU  - Hill, Michael [Univ. of California, Davis, CA (United States)]
AU  - Johnson, Kyle [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies]
AU  - Nycz, Andrzej [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000174156559)
AU  - Masuo, Chris [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000341605658)
AU  - Carter, William [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000203137534)
AU  - Roy, Sougata [Iowa State Univ., Ames, IA (United States)] (ORCID:0000000329501290)
AU  - Simunovic, Srdjan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000177668293)
AU  - Boyce, Brad L. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies] (ORCID:0000000159941743)
PY  - 2026
DO  - 10.1007/s40192-026-00469-y
UR  - https://www.osti.gov/biblio/3384999
ID  - 3384999
ER  -