@misc{indiciae34c8e7e65c20,
  title = {Secondary Electron plume imaging and applications for mapping electric fields},
  author = {Alcorn, Francis Marion [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:000000022413704X) and Perez, Christopher [Stanford University] and Smoll, Eric James [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000319554671) and Ghosal, Debjit [NREL] and Salagre Rubio, Elena [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000196729987) and Blackburn, Jeffrey L. [NREL] and Kumar, Suhas [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] and Chandler, David W. [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000320762507) and Talin, Albert Alec [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:000000021102680X)},
  year = {2025},
  doi = {10.2172/3385132},
  url = {https://www.osti.gov/biblio/3385132},
  note = {Source identifier: 3385132}
}