@misc{indiciaee24d6d64f37d,
  title = {SEM/EBSD Characterization of Baffle-Former Bolts Designated for High Energy X-ray Microscopy Studies at the Advanced Photon Source},
  author = {Lach, Tim [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000247454179) and Gussev, Maxim N. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000168140737)},
  year = {2025},
  doi = {10.2172/3395430},
  url = {https://www.osti.gov/biblio/3395430},
  note = {Source identifier: 3395430}
}