@misc{indiciae6f366a840a9b,
  title = {Highly Accelerated Stress Screening (HASS) of Electronics Assemblies: A Case Study},
  author = {McClary, Scott Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000190111043) and Collins, Elmer W. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]},
  year = {2026},
  doi = {10.2172/3395500},
  url = {https://www.osti.gov/biblio/3395500},
  note = {Source identifier: 3395500}
}