TY  - RPRT
TI  - Highly Accelerated Stress Screening (HASS) of Electronics Assemblies: A Case Study
AU  - McClary, Scott Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000190111043)
AU  - Collins, Elmer W. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
PY  - 2026
DO  - 10.2172/3395500
UR  - https://www.osti.gov/biblio/3395500
ID  - 3395500
ER  -