TY  - RPRT
TI  - Phenomena-based graph representations and applications to chemical process simulation
AU  - Cortés-Peña, Yoel R. [Univ. of Wisconsin, Madison, WI (United States)]
AU  - Zavala, Victor M. [Univ. of Wisconsin, Madison, WI (United States)] (ORCID:0000000257447378)
PY  - 2026
DO  - 10.1016/j.compchemeng.2026.109756
UR  - https://www.osti.gov/biblio/3400798
ID  - 3400798
ER  -