TY  - RPRT
TI  - Entropy-defect synergy for dual luminescence mechanism in spinel: Time-resolved anti-counterfeiting and fingerprint visualization
AU  - Pan, Zemeng [Chongqing Sanxia University of Science and Technology (China); Xi'an Jiaotong University (China)]
AU  - Wang, Shifa [Chongqing Sanxia University of Science and Technology (China)]
AU  - Yang, Jingyi [Chongqing Sanxia University of Science and Technology (China)]
AU  - Mo, Peilin [Chongqing Sanxia University of Science and Technology (China)]
AU  - Chen, Yanming [Chongqing Sanxia University of Science and Technology (China); Xi'an Jiaotong University (China)]
AU  - Gao, Huajing [Chongqing University of Posts and Telecommunications (China)]
AU  - Zhou, Xianju [Chongqing University of Posts and Telecommunications (China)]
AU  - Li, Dengfeng [Chongqing University of Posts and Telecommunications (China)]
AU  - Yang, Hua [Lanzhou University of Technology (China)]
AU  - Zhang, Huijun [Xi'an Jiaotong University (China)]
AU  - Fang, Leiming [China Academy of Engineering Physics (CAEP), Sichuan (China)]
AU  - Ding, Qingping [Ames Laboratory, and Iowa State University, Ames, IA (United States)]
PY  - 2026
DO  - 10.1016/j.cej.2026.180134
UR  - https://www.osti.gov/biblio/3402225
ID  - 3402225
ER  -