@misc{indiciae3ae7a4b2d6ac,
  title = {Soft X-ray reflection ptychography},
  author = {Guenzing, Damian [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] and Sasaki, Dayne Y. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States); Massachusetts Institute of Technology, Cambridge, MA (United States)] (ORCID:000000023800992X) and Ditter, Alexander S. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] and Levitan, Abraham L. [Paul Scherrer Institute PSI, Villigen (Switzerland)] (ORCID:0000000245682637) and Gullikson, Eric M. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:0000000303377674) and Dhuey, Scott [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] and Gashi, Arian [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] and Ohldag, Hendrik [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] and Roy, Sujoy [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] and Shapiro, David A. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] and Comin, Riccardo [Massachusetts Institute of Technology, Cambridge, MA (United States)] and Morley, Sophie A. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:0000000181972431)},
  year = {2026},
  doi = {10.1364/oe.591755},
  url = {https://www.osti.gov/biblio/3407895},
  note = {Source identifier: 3407895}
}