TY  - RPRT
TI  - Soft X-ray reflection ptychography
AU  - Guenzing, Damian [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)]
AU  - Sasaki, Dayne Y. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States); Massachusetts Institute of Technology, Cambridge, MA (United States)] (ORCID:000000023800992X)
AU  - Ditter, Alexander S. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)]
AU  - Levitan, Abraham L. [Paul Scherrer Institute PSI, Villigen (Switzerland)] (ORCID:0000000245682637)
AU  - Gullikson, Eric M. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:0000000303377674)
AU  - Dhuey, Scott [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)]
AU  - Gashi, Arian [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)]
AU  - Ohldag, Hendrik [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)]
AU  - Roy, Sujoy [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)]
AU  - Shapiro, David A. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)]
AU  - Comin, Riccardo [Massachusetts Institute of Technology, Cambridge, MA (United States)]
AU  - Morley, Sophie A. [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:0000000181972431)
PY  - 2026
DO  - 10.1364/oe.591755
UR  - https://www.osti.gov/biblio/3407895
ID  - 3407895
ER  -