@misc{indiciae1fd30521a478,
  title = {Optimal Geometry for Focused Ion Beam-Milled Samples for Direct-Pull Micro-Tensile Testing Performed In Situ in a Scanning Electron Microscope},
  author = {Yin, Daniel (ORCID:0000000268981218) and Sun, Haiping (ORCID:0009000653287342) and Misra, Amit (ORCID:0000000336346823)},
  year = {2024},
  doi = {10.3390/ma17215144},
  url = {https://www.osti.gov/biblio/3677218},
  note = {Source identifier: 3677218}
}