TY  - RPRT
TI  - Impact of Crystalline Phases on Low-Activity Waste Glass Durability: Insights from PCT and VHT
AU  - Chong, Saehwa
AU  - Reiser, Joelle T.
AU  - Ferkl, Pavel
AU  - Riley, Brian J. (ORCID:0000000277456730)
AU  - Vienna, John D.
AU  - Crum, Jarrod V.
AU  - Lu, Xiaonan (ORCID:0000000179708148)
PY  - 2026
DO  - 10.1016/j.jnoncrysol.2026.124271
UR  - https://www.osti.gov/biblio/3732645
ID  - 3732645
ER  -