TY  - RPRT
TI  - Intrinsic even-odd thickness-driven anomalous Hall effect in epitaxial MnBi2⁢Te4 thin films
AU  - Mallick, Deb [ORNL] (ORCID:000900005806411X)
AU  - Kim, Simon [ORNL] (ORCID:000000016904101X)
AU  - Chen, Jane [ORNL] (ORCID:0000000203399657)
AU  - Vazquez-Lizardi, Gabriel [ORNL] (ORCID:0000000175858317)
AU  - Mazza, Alessandro [ORNL] (ORCID:0000000272061334)
AU  - Ward, Zac [ORNL] (ORCID:0000000210279186)
AU  - Eres, Gyula [ORNL] (ORCID:0000000326905214)
AU  - Mukherjee, Debangshu [ORNL] (ORCID:0000000304379807)
AU  - Miao, Hu [ORNL] (ORCID:0000000310785713)
AU  - Nelson, Christopher [ORNL] (ORCID:0000000178928907)
AU  - Hickey, Danielle [University of Minnesota]
AU  - Moore II, Rob [ORNL] (ORCID:0000000216085411)
AU  - Brahlek, Matthew [ORNL] (ORCID:0000000329000648)
AU  - Cao, Yue [Brookhaven National Laboratory (BNL)]
AU  - Wu, Liang [University of Pennsylvania]
PY  - 2026
DO  - 10.1103/pqj7-prc1
UR  - https://www.osti.gov/biblio/3739941
ID  - 3739941
ER  -