TY  - RPRT
TI  - Atomic faulting drives exceptional toughness in low thermal expansion chromium alloys
AU  - Yu, Chengyi [University of Science and Technology Beijing, China]
AU  - Wu, Honghui [University of Science and Technology Beijing]
AU  - Zhu, Huihui [University of Science and Technology Beijing]
AU  - Chen, Xin [University of Science and Technology Beijing, China]
AU  - Zhang, Qinghua [Chinese Academy of Sciences (CAS)]
AU  - Gu, Lin [Chinese Academy of Sciences]
AU  - Frontzek, Matthias [ORNL] (ORCID:0000000187048928)
AU  - Chen, Yan [ORNL] (ORCID:0000000160951754)
AU  - An, Ke [ORNL] (ORCID:000000026093429X)
AU  - He, Lunhua [China Spallation Neutron Source, Guangdong, China]
AU  - Kato, Kenichi [RIKEN SPring- 8 Center]
AU  - Kawaguchi, Shogo [RIKEN SPring-8 Center (RSC), Japan]
AU  - Qiao, Zeyu [University of Science and Technology Beijing]
AU  - Zhou, Meisa [University of Science and Technology Beijing]
AU  - Cao, Yili [University of Science and Technology Beijing, China]
AU  - Li, Qiang [University of Science and Technology Beijing, China]
AU  - Deng, Jinxia [University of Science and Technology Beijing, China]
AU  - Lin, Kun [University of Science and Technology Beijing, China]
AU  - Xing, Xianran [University of Science and Technology Beijing, China]
AU  - Zhang, Qiang [ORNL] (ORCID:0000000303897039)
AU  - Chen, Yujie [Tsinghua University, China]
PY  - 2026
DO  - 10.1038/s41467-026-69365-5
UR  - https://www.osti.gov/biblio/3740826
ID  - 3740826
ER  -