TY  - RPRT
TI  - Processing effects on microstructure in Er and ErD2 thin-films.
AU  - Kammler, Daniel R
AU  - Parish, Chad
AU  - Snow, Clark Sheldon
AU  - Brewer, Luke N
PY  - 2010
UR  - https://www.osti.gov/biblio/991856
ID  - 991856
ER  -