TY  - RPRT
TI  - Chip Analysis and Characterization
AU  - Abu-Nimeh, Faisal
AU  - Doering, Dionisio
PY  - 2017
DO  - 10.11578/dc.20220825.3
UR  - https://www.osti.gov/biblio/code-80320
ID  - code-80320
ER  -